Printed circuit boards and their assemblies (PCB & PCBA) are the core components of electronic products, and their reliability directly determines the overall reliability of electronic products. To ensure and enhance the quality and reliability of electronic products, it is essential to carry out comprehensive physical and chemical analyses of failures, identify the underlying failure mechanisms, and then propose corresponding improvement measures. MTT possesses profound technical expertise in board-level failure analysis, a complete range of analytical methods, a vast database of case studies, and a team of experienced experts, providing you with high-quality and efficient failure analysis services.
The purpose of electronic component failure analysis is to employ a variety of testing and analytical techniques and procedures to identify the failure phenomena of electronic components, determine their failure modes and mechanisms, identify the ultimate root cause of failure, and propose recommendations for improvements in design and manufacturing processes. This helps prevent the recurrence of failures and improves the overall reliability of the components.
The continuous rise in complexity and performance requirements of integrated circuits, combined with potential risks across design, manufacturing, packaging, and application stages, has led to frequent occurrences of critical failure modes such as short circuits, open circuits, leakage, burnout, and parameter drift. These issues not only result in costly device scrapping and system downtime but also often trigger disputes over responsibility among designers, foundries, packaging and testing houses, and end-users, causing significant economic losses and reputational risks.
The performance requirements for polymer materials continue to rise, while differences in understanding of high-demand products and processes between customers and suppliers often lead to frequent failures such as fracture, cracking, corrosion, and discoloration. These failures frequently cause disputes over responsibility and result in significant economic losses.
The increasingly harsh service environments of metal components place higher demands on material performance and structural reliability. However, factors such as design flaws, material defects, manufacturing deviations, or improper use can readily trigger typical failures including fatigue fracture, stress corrosion cracking, hydrogen embrittlement, creep, wear, and overload deformation.
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Meixin Testing leverages its technological edge in constructing massive failure databases, showcasing its capabilities through comprehensive case studies, solutions for complex scenarios, partnerships with leading enterprises, and systematic intellectual property. Drawing on millions of failure analyses, it delivers precise insights into root causes, enabling inspection reports to provide robust support for clients' quality upgrades and achieve zero failures.
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Stay updated with the latest news from Maxin Testing, including technical developments, exhibitions, and events. We build on a foundation of professional testing to deliver customized solutions for our clients, ensuring quality control from the source. This empowers our clients to stand out in the marketplace and achieve commercial success.
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Maxin Testing is a nationally accredited commercial third-party laboratory. We specialize in providing testing services, technical consulting services, and solution services to clients across industries including electronics manufacturing, automotive electronics, semiconductors, and aerospace materials.
Maxin Testing operates laboratory facilities in Shenzhen, Suzhou, and Beijing, featuring multidisciplinary testing and analytical laboratories. The company pioneers an industrial hospital service model grounded in materials science engineering and electronic reliability engineering.
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Thermal EMMI

Thermal EMMI(Thermal Emission Microscopy Imaging,热发射显微镜成像)是一项专注于电子元器件和集成电路故障分析的前沿技术应用项目。该项目利用先进的热发射显微镜技术,能够精准地定位在工作状态下电子设备中产生异常热量的区域,即热点,这些热点往往与潜在的故障或缺陷密切相关。通过对热点的准确识别和分析,Thermal EMMI 项目旨在为电子设备的研发、生产以及质量控制提供关键的技术支持,从而提高产品的可靠性和性能。

Thermal EMMI

| 项目概述

 

Thermal EMMI(Thermal Emission Microscopy Imaging,热发射显微镜成像)是一项专注于电子元器件和集成电路故障分析的前沿技术应用项目。该项目利用先进的热发射显微镜技术,能够精准地定位在工作状态下电子设备中产生异常热量的区域,即热点,这些热点往往与潜在的故障或缺陷密切相关。通过对热点的准确识别和分析,Thermal EMMI 项目旨在为电子设备的研发、生产以及质量控制提供关键的技术支持,从而提高产品的可靠性和性能。

 

 

| 测试目的

 

1.确认金属之间的短路、漏电和击穿

2.器件电阻异常

3.器件上的温度分布

 

 

| 试验标准

 

Thermal EMMI 项目遵循依客户要求的标准进行测试和分析。

 

 

| 服务产品/领域

 

Thermal EMMI 项目广泛应用于 PCBA(印刷电路板组件)、芯片、MOS(金属氧化物半导体场效应晶体管)、元器件等电子设备的故障分析领域。这些领域对产品的可靠性和性能要求极高,通过 Thermal EMMI 项目可以及时发现并解决潜在的故障问题,提高产品的整体质量。

 

 

| 项目优势

 

1、高分辨率:Thermal EMMI 技术能够实现纳米级别的热点定位,具有很高的分辨率和精度。

2、非接触式测试:测试过程中无需接触样品,不会对样品造成损伤,适用于各种封装形式的电子元器件和集成电路。

3、实时监测:可以实时监测样品的热效应,快速准确地定位热点,提高测试效率。

4、多功能性:除了热点定位,Thermal EMMI 技术还可以用于热分析、热管理和可靠性评估等方面。

 

 

| 美信优势

 

1、专业团队:拥有多名经验丰富的检测工程师和技术专家。

2、先进设备:配备国际领先的检测设备,确保检测结果的准确性和可靠性。

3、高效服务:快速响应客户需求,提供一站式高效检测服务。

4、权威认证:实验室通过ISO/IEC 17025认证,检测报告具有国际公信力

 

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