| Project Overview

X-ray Photoelectron Spectroscopy (XPS) is a surface analysis method in which a sample is irradiated with X-rays, causing the excitation and emission of inner-shell or valence electrons from atoms or molecules. The electrons emitted through photon excitation are called photoelectrons. By measuring the energy and quantity of these photoelectrons, the composition of the material under investigation can be determined. The primary application of XPS is to determine the binding energy of electrons in order to identify the chemical properties and composition of a sample surface. Its characteristic feature lies in the fact that photoelectrons originate from within 10 nm of the surface, carrying only surface chemical information. With advantages such as small analytical area, shallow analysis depth, and non-destructive measurement, it is widely applied to the study of metals, inorganic materials, catalysts, polymers, coating materials, and ores, as well as to research involving processes such as corrosion, friction, lubrication, adhesion, catalysis, coating, and oxidation.

| Test Objective

(1) When minute foreign substances are present on the product surface and conventional composition testing methods cannot accurately perform qualitative and quantitative analysis, XPS may be selected. XPS can analyze the composition of foreign particles with diameters ≥10 μm and determine their elemental valence states, thereby identifying the chemical state of the contaminants and providing precise data for failure mechanism analysis.

(2) When the surface film layer of a product is too thin for conventional methods to measure thickness, XPS can be employed. By using the depth sputtering function of XPS, film thicknesses ≥20 nm can be measured.

(3) When a product surface contains multiple thin film layers and it is necessary to measure the thickness and composition of each layer, D-SIMS can be applied to accurately determine both the thickness and the compositional content of each thin film.

(4) When substances containing multiple valence states of the same element exist on the product surface, and conventional testing methods cannot distinguish the proportions of the different valence states, XPS valence state analysis can be considered to determine the relative proportions of each valence state of the element.

Precautions for X-ray Photoelectron Spectroscopy (XPS) Analysis

(1) The maximum sample size is 1 × 1 × 0.5 cm. If the sample exceeds this size, it shall be cut prior to testing.

(2) During sampling, avoid any contact between hands or tools and the test area. After the sample is removed, use vacuum packaging or other packaging that isolates it from the external environment to prevent contamination that could affect analytical results.

(3) Samples for XPS testing may be sputter-coated with a thin layer of gold (≤1 nm) to allow testing of samples with weak conductivity; however, insulating samples cannot be analyzed.

(4) The elemental analysis range of XPS covers Li to U. It is limited to testing inorganic substances and cannot analyze organic materials, with a detection limit of 0.1%.

| MTT Advantages

1. Professional Team: Equipped with a number of highly experienced testing engineers and technical experts.

2. Advanced Equipment: Equipped with internationally leading testing instruments to ensure accuracy and reliability of results.

3. Efficient Service: Rapidly respond to customer needs and provide one-stop, high-efficiency inspection services.

4. Authoritative Certification: The laboratory is certified by ISO/IEC 17025, ensuring that test reports have international credibility.