
序号 No. |
试验项目 Test items |
检查内容 Inspection Items |
预防的失效模式 Preventive failure modes |
1 |
外部目检 External visual inspection |
包封平整度、形变 Encapsulation flatness and deformation |
外观缺陷 Apparent defect |
2 |
X射线检查 X-ray inspection |
器件内部结构、引线、引线框架 Internal device structure, leads, lead frames |
结构问题、装配工艺不良 Structural issues, defective assembly processes |
3 |
颗粒碰撞噪声检测 Particle collision noise detection |
可动微粒 Mobile particles |
可动颗粒引发随机短路 Mobile particles causing random short circuits |
4 |
密封性测试 Seal test |
密封性 Sealing |
不良气氛引起的电性能漂移 Electrical parameter drift caused by an adverse atmosphere |
5 |
内部气氛分析 Internal atmosphere analysis |
封装内部气氛类型 Types of internal atmosphere within the package |
腐蚀,参数漂移 Corrosion, parameter drift |
6 |
内部目检 Internal visual inspection |
芯片金属化层、钝化层、划片、引线键合、芯片安装、外来物质等等 Chip metallization layer, passivation layer, dicing, wire bonding, chip mounting, foreign materials, etc. |
加工工艺不良引入的缺陷 Defects introduced by poor manufacturing processes |
7 |
键合强度 Bonding strength |
内引线键合强度 Inner wire bonding strength |
互连开路、间歇失效 Interconnect open circuits and intermittent failures |
8 |
扫描电镜 Scanning electron microscope |
类似于“内部目检” Similar to “internal visual inspection” |
加工工艺不良引入的缺陷 Defects introduced by poor manufacturing processes |
9 |
芯片剪切强度 Chip shear strength |
芯片的粘结强度 Chip adhesion strength |
芯片脱离导致的开路和散热不良失效 Open circuits and poor heat dissipation failures caused by chip detachment |