Printed circuit boards and their assemblies (PCB & PCBA) are the core components of electronic products, and their reliability directly determines the overall reliability of electronic products. To ensure and enhance the quality and reliability of electronic products, it is essential to carry out comprehensive physical and chemical analyses of failures, identify the underlying failure mechanisms, and then propose corresponding improvement measures. MTT possesses profound technical expertise in board-level failure analysis, a complete range of analytical methods, a vast database of case studies, and a team of experienced experts, providing you with high-quality and efficient failure analysis services.
The purpose of electronic component failure analysis is to employ a variety of testing and analytical techniques and procedures to identify the failure phenomena of electronic components, determine their failure modes and mechanisms, identify the ultimate root cause of failure, and propose recommendations for improvements in design and manufacturing processes. This helps prevent the recurrence of failures and improves the overall reliability of the components.
The continuous rise in complexity and performance requirements of integrated circuits, combined with potential risks across design, manufacturing, packaging, and application stages, has led to frequent occurrences of critical failure modes such as short circuits, open circuits, leakage, burnout, and parameter drift. These issues not only result in costly device scrapping and system downtime but also often trigger disputes over responsibility among designers, foundries, packaging and testing houses, and end-users, causing significant economic losses and reputational risks.
The performance requirements for polymer materials continue to rise, while differences in understanding of high-demand products and processes between customers and suppliers often lead to frequent failures such as fracture, cracking, corrosion, and discoloration. These failures frequently cause disputes over responsibility and result in significant economic losses.
The increasingly harsh service environments of metal components place higher demands on material performance and structural reliability. However, factors such as design flaws, material defects, manufacturing deviations, or improper use can readily trigger typical failures including fatigue fracture, stress corrosion cracking, hydrogen embrittlement, creep, wear, and overload deformation.
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Meixin Testing leverages its technological edge in constructing massive failure databases, showcasing its capabilities through comprehensive case studies, solutions for complex scenarios, partnerships with leading enterprises, and systematic intellectual property. Drawing on millions of failure analyses, it delivers precise insights into root causes, enabling inspection reports to provide robust support for clients' quality upgrades and achieve zero failures.
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Stay updated with the latest news from Maxin Testing, including technical developments, exhibitions, and events. We build on a foundation of professional testing to deliver customized solutions for our clients, ensuring quality control from the source. This empowers our clients to stand out in the marketplace and achieve commercial success.
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Maxin Testing is a nationally accredited commercial third-party laboratory. We specialize in providing testing services, technical consulting services, and solution services to clients across industries including electronics manufacturing, automotive electronics, semiconductors, and aerospace materials.
Maxin Testing operates laboratory facilities in Shenzhen, Suzhou, and Beijing, featuring multidisciplinary testing and analytical laboratories. The company pioneers an industrial hospital service model grounded in materials science engineering and electronic reliability engineering.
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Sealing Device
Sealing Device

序号

No.

试验项目

Test items

检查内容

Inspection Items

预防的失效模式

Preventive failure modes

1

外部目检

External visual inspection

包封平整度、形变

Encapsulation flatness and deformation

外观缺陷

Apparent defect

2

X射线检查

X-ray inspection

器件内部结构、引线、引线框架

Internal device structure, leads, lead frames

结构问题、装配工艺不良

Structural issues, defective assembly processes

3

颗粒碰撞噪声检测

Particle collision noise detection

可动微粒

Mobile particles

可动颗粒引发随机短路

Mobile particles causing random short circuits

4

密封性测试

Seal test

密封性

Sealing

不良气氛引起的电性能漂移

Electrical parameter drift caused by an adverse atmosphere

5

内部气氛分析

Internal atmosphere analysis

封装内部气氛类型

Types of internal atmosphere within the package

腐蚀,参数漂移

Corrosion, parameter drift

6

内部目检

Internal visual inspection

芯片金属化层、钝化层、划片、引线键合、芯片安装、外来物质等等

Chip metallization layer, passivation layer, dicing, wire bonding, chip mounting, foreign materials, etc.

加工工艺不良引入的缺陷

Defects introduced by poor manufacturing processes

7

键合强度

Bonding strength

内引线键合强度

Inner wire bonding strength

互连开路、间歇失效

Interconnect open circuits and intermittent failures

8

扫描电镜

Scanning electron microscope

类似于“内部目检”

Similar to “internal visual inspection”

加工工艺不良引入的缺陷

Defects introduced by poor manufacturing processes

9

芯片剪切强度

Chip shear strength

芯片的粘结强度

Chip adhesion strength

芯片脱离导致的开路和散热不良失效

Open circuits and poor heat dissipation failures caused by chip detachment

 

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