| Project Overview

X-ray Diffraction (XRD) Technology. By subjecting materials to X-ray diffraction and analyzing the diffraction patterns, this research method obtains information on material composition as well as the structure and morphology of atoms or molecules within the material. X-ray diffraction analysis is one of the primary methods for studying the phase composition and crystal structure of substances. When a substance (crystalline or amorphous) undergoes diffraction analysis, irradiation by X-rays produces varying degrees of diffraction. The composition, crystal form, bonding patterns within molecules, molecular configuration, and conformation determine the unique diffraction pattern characteristic of the substance. X-ray diffraction offers advantages such as non-destructive testing, absence of contamination, rapid analysis, high measurement accuracy, and the ability to obtain extensive information regarding crystal integrity. Therefore, as a modern scientific method for analyzing material structure and composition, X-ray diffraction analysis has been increasingly and widely applied in research across various disciplines as well as in industrial production.

| Test Objective

(1) When a material is composed of multiple crystalline components and it is necessary to distinguish the proportion of each component, the phase identification function of XRD can be used to analyze the relative proportions of the crystalline phases.

(2) The performance of many materials is determined by their degree of crystallinity. XRD crystallinity analysis can be employed to determine the crystallinity of a material.

(3) The development of new materials requires a thorough understanding of lattice parameters. XRD can rapidly measure lattice parameters, providing performance verification indicators for the development and application of new materials.

(4) When products exhibit failures such as fracture or deformation during use, these may be related to the influence of microscopic stress. XRD can be used to rapidly measure microstress.

(5) Due to their very small particle size, nanoparticles are prone to agglomeration, and the use of conventional particle size analyzers often results in inaccurate data. By applying the X-ray diffraction line broadening method (Scherrer method), the average particle size of nanoparticles can be determined.

| Application Example

Sample Information: The submitted test sample was a white powder identified as pearl powder, and the client requested phase identification. This test was conducted using a Rigaku D/max 2500 X-ray diffractometer.

Test Parameters: Tube voltage 40 kV, tube current 200 μA, Cu target, diffraction slit width DS = SS = 1°, RS = 0.3 mm, scanning speed 2.000 (°·min⁻¹), scanning range 10°–80°.

| Test Spectrum

Test Results: The main component of the sample was identified as calcium carbonate.

| MTT Advantages

1. Professional Team: A team of highly experienced testing engineers and technical experts.

2. Advanced Equipment: Equipped with internationally leading testing instruments to ensure accuracy and reliability of results.

3. Efficient Service: Rapidly respond to customer needs and provide one-stop, high-efficiency inspection services.

4. Authoritative Certification: The laboratory is certified by ISO/IEC 17025, ensuring that test reports have international credibility.

Precautions for X-ray Diffraction (XRD) Technology

(1) Solid samples should have a surface area greater than 10 × 10 mm and a thickness above 5 μm. The surface shall be flat, and multiple pieces may be bonded together if necessary.

(2) For lamellar or cylindrical samples, significant preferred orientation may occur, leading to abnormal diffraction intensity. Therefore, the testing direction shall be specified.

(3) For measuring microstress (lattice distortion) in metallic samples and for residual austenite measurement, the sample shall be prepared as a metallographic specimen and subjected to standard polishing or electrolytic polishing to eliminate the surface strain layer.

(4) Powder samples shall be ground to a particle size of 320 mesh (approximately 40 μm in diameter), with a total weight greater than 5 g.